Coating thickness measurement （Al 13 to U 92）
Measurement of transparent layer thickness
Applied Spectroscopy film thickness gauge，Using the principle of white light interference, non-contact, non-destructive transmission layer thickness measurement can be realized: single-layer, double-layer, and even three-layer thickness measurement can be realized.
The Bowman Full-Service Standards Laboratory is ISO/IEC 17025:2017 accredited for calibration.
View our Scope of Accreditation and our Certificate of Accreditation.
Bowman XRF Film thickness analysis technology：
↘ Guaranteed IPC 4552 capable
↘ Thickness measurement, elemental analysis, plating solution analysis
↘ Fast non-destructive measurement with a detection limit as low as 1nm
↘ Collimator type that meet conventional applications
↘ Poly-capillary optics type that can measure micron level areas
↘ RoHS screening analysis is optional
↘ Can comply with SEMI S2, S8 compliant-ready
Real time monitoring of plasma emission state
Applied Spectroscopy Optical fiber coupled TranSpec process spectrometer, Throughout UV... NIR spectral range enables simultaneous real-time monitoring of PVD plasma.
Non-Contact Eddy Current Technology
The eddy current testing method is a nondestructive evaluation method. It is widely used for crack detection as cracks cause very large local conductivity changes. However, there are many other applications in which highly sensitive and spatially resolved conductivity analysis can help to solve various inspection tasks. The basic principle is shown below.
Non-contact testing solution for different applications:
Characteristics
- Contactless and nondestructive
- extremely fast / high sample rates (k samples / second)
- good automation abilities
- high sensitivit
Non-destructive eddy current technology
- Sheet resistance
- Resistivity
- Metal thickness
- Electrical Anisotropy
- Distance (to conductive materials) / - - paint thickness
- Carbon fiber testing
- Composition monitoring
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Technology & Capabilities
